Based on Attocube scanning probe microscopy(SPM) platform, the local physical properties of thin film samples or 2D device samples can be detected by changing different tips which lateral limit resolution is about 40 nm, e.g., using magntic tips to detect local magnetism (MFM) and conducting tips to detect electrical property (c-AFM). Moreover, a 3 Gigahertz microwave can be integrated on our SPM for measuring the variation of local permittivity and conductivity(sMIM), e.g., detect the metal-isulator phase transition and the topological edge state in Quantum spin Hall system(topological insulator). Our system can work in different temperature and magntic field.(temperature range: 1.8-300 K and magnetic field range: 0-9 T.)